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| NO | Title, Author(s) (Publication Title, Volume Issue, Page, Issue Date) |
|---|---|
| E-field induced keep-out zone determination method of through-silicon vias for 3-D ICs Kim, Kibeom; Choi, Junsung; Woo, Seongho; Cho, Jaeyong; Ahn, Seungyoung, MICROELECTRONICS RELIABILITY, v.98, pp.161 - 164, 2019-07 | |
| COMPLIANCE TESTING FOR HUMAN BODY MODEL EXPOSURE TO ELECTROMAGNETIC FIELDS FROM A HIGH-POWER WIRELESS CHARGING SYSTEM FOR DRONES Ahn, Jangyong; Hong, Seon-Eui; Kim, Haerim; Chun, Yangbae; Choi, Hyung-Do; Kim, Kibeom; Andres, Brito; Choi, Junsung; Ahn, Seungyoung, RADIATION PROTECTION DOSIMETRY, v.189, no.1, pp.13 - 27, 2020-03 |
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