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NO | Title, Author(s) (Publication Title, Volume Issue, Page, Issue Date) |
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Beam propagation analysis on thickness measurements in quantitative phase microscopy Bae, Yoon-Sung; Song, Jong-In; Har, Dongsoo; Kim, Dug Young, OPTICAL REVIEW, v.22, no.4, pp.532 - 538, 2015-08 |
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