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NO | Title, Author(s) (Publication Title, Volume Issue, Page, Issue Date) |
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E-field induced keep-out zone determination method of through-silicon vias for 3-D ICs Kim, Kibeom; Choi, Junsung; Woo, Seongho; Cho, Jaeyong; Ahn, Seungyoung, MICROELECTRONICS RELIABILITY, v.98, pp.161 - 164, 2019-07 |
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