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A Two-Line Time-Domain Gating Method for Characterization of Test Fixture With via Hole Discontinuity

Cho, Jaeyong; Kim, Byung-Sung; Jeong, Jonghyuk; Kim, Junseong; Kim, Kibeom; Hwang, Karam; Lee, Hwiseob; et al, IEEE MICROWAVE AND WIRELESS COMPONENTS LETTERS, v.27, no.10, pp.936 - 938, 2017-10

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