Browse "MA-Theses_Ph.D.(박사논문) " by Subject Defect inspection▼asemiconductor image▼aFast-MCD method▼aneural network▼adouble-fit method▼asingular value decomposition
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| Defect inspection in semiconductor images using statistical methods and neural networks = 통계적 방법과 신경망을 이용한 반도체 영상에서 결함 검사link Yu, Jinkyu; Lee, Chang-Ock; et al, 한국과학기술원, 2023 |
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Type
- 351 Thesis(Ph.D)
Open Access
Date issued
- 55 2020 - 2023
- 124 2010 - 2019
- 112 2000 - 2009
- 64 1990 - 1999
- 4 1988 - 1989