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Results 1-1 of 1 (Search time: 0.003 seconds).

NO Title, Author(s) (Publication Title, Volume Issue, Page, Issue Date)
1
Heuristics for scheduling burn-in operations in a semiconductor test facility to minimize total tardiness = 반도체 제조 공정 중 번인 공정에서의 납기를 고려한 스케줄링 알고리듬 개발link

Lee, Kyoung-Eun; 이경은; Kim, Yeong-Dae; 김영대, 한국과학기술원, 2005

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