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Browse "MS-Theses_Master(석사논문)" by Subject Interconnect▼aRuthenium▼aMolybdenum▼aEM▼aTDDB▼aBarrier-less▼aResistivity▼aThermal diffusivity▼aAccelerated life test

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Study on electromigration and time dependent dielectric breakdown reliabilities of ruthenium and molybdenum for next-generation interconnection = 차세대 배선 적용을 위한 루테늄과 몰리브데넘의 EM과 TDDB 신뢰성 연구link

Kim, Jungkyun; 김정균; et al, 한국과학기술원, 2023

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