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NO Title, Author(s) (Publication Title, Volume Issue, Page, Issue Date)
1
(A) numerical study of point defects in silicon single crystal in a Czochralski process = 초크랄스키공정에서 실리콘 단결정에 존재하는 점 결함에 관한 수치해적 연구link

Kim, Jong-Seon; 김종선; Lee, Tai-Yong; 이태용, 한국과학기술원, 2000

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