DC Field | Value | Language |
---|---|---|
dc.contributor.author | Jung, SI | ko |
dc.contributor.author | Choi, JS | ko |
dc.contributor.author | Shim, HC | ko |
dc.contributor.author | Kim, Soohyun | ko |
dc.contributor.author | Jo, SH | ko |
dc.contributor.author | Lee, CJ | ko |
dc.date.accessioned | 2007-12-18T05:52:53Z | - |
dc.date.available | 2007-12-18T05:52:53Z | - |
dc.date.created | 2012-02-06 | - |
dc.date.created | 2012-02-06 | - |
dc.date.issued | 2006-12 | - |
dc.identifier.citation | APPLIED PHYSICS LETTERS, v.89, pp.389 - 395 | - |
dc.identifier.issn | 0003-6951 | - |
dc.identifier.uri | http://hdl.handle.net/10203/2510 | - |
dc.description.abstract | Probe-typed carbon nanotube (CNT) point emitter was fabricated by attaching single-walled CNT (SWCNT) and double-walled CNT (DWCNT) bundles onto the atomic force microscope tip using dielectrophoresis method. The field emission current from SWCNT point emitter was 4.9 mu A at 750 V, which is corresponding to the emission current density of at least 1.2x10(3) A/cm(2). The Fowler-Nordheim plots for the SWCNT and DWCNT point emitters revealed that the SWCNT bundle consists of more individual SWCNTs than DWCNT bundle and, as a result, the field emission performance of the SWCNT point emitter is better than the DWCNT point emitter. It is suggested that the probe-typed CNT point emitters can be used for microwave amplifiers and high-resolution electron-beam instruments. (c) 2006 American Institute of Physics. | - |
dc.description.sponsorship | This work was supported by National R&D Project for Nano Science and Technology and supported by the SRC program of Center for Nanotubes and Nanostructured Composites of MOST/KOSEF and supported by the Ministry of Commerce, Industry, and Energy of Korea through a ComThis work was supported by National R&D Project for Nano Science and Technology and supported by the SRC program of Center for Nanotubes and Nanostructured Composites of MOST/KOSEF and supported by the Ministry of Commerce, Industry, and Energy of Korea through a Components and Materials Technology Development Project | en |
dc.language | English | - |
dc.language.iso | en_US | en |
dc.publisher | AMER INST PHYSICS | - |
dc.subject | ELECTRON FIELD-EMISSION | - |
dc.subject | TIP | - |
dc.subject | ENHANCEMENT | - |
dc.subject | CATHODE | - |
dc.subject | ARRAYS | - |
dc.subject | FILMS | - |
dc.subject | WIRE | - |
dc.title | Fabrication of probe-typed carbon nanotube point emitters | - |
dc.type | Article | - |
dc.identifier.wosid | 000242709200099 | - |
dc.identifier.scopusid | 2-s2.0-33845411270 | - |
dc.type.rims | ART | - |
dc.citation.volume | 89 | - |
dc.citation.beginningpage | 389 | - |
dc.citation.endingpage | 395 | - |
dc.citation.publicationname | APPLIED PHYSICS LETTERS | - |
dc.identifier.doi | 10.1063/1.2402222 | - |
dc.embargo.liftdate | 9999-12-31 | - |
dc.embargo.terms | 9999-12-31 | - |
dc.contributor.localauthor | Kim, Soohyun | - |
dc.contributor.nonIdAuthor | Jung, SI | - |
dc.contributor.nonIdAuthor | Choi, JS | - |
dc.contributor.nonIdAuthor | Shim, HC | - |
dc.contributor.nonIdAuthor | Jo, SH | - |
dc.contributor.nonIdAuthor | Lee, CJ | - |
dc.type.journalArticle | Article | - |
dc.subject.keywordPlus | ELECTRON FIELD-EMISSION | - |
dc.subject.keywordPlus | TIP | - |
dc.subject.keywordPlus | ENHANCEMENT | - |
dc.subject.keywordPlus | CATHODE | - |
dc.subject.keywordPlus | ARRAYS | - |
dc.subject.keywordPlus | FILMS | - |
dc.subject.keywordPlus | WIRE | - |
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