Depth from a Light Field Image with Learning-based Matching Costs

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dc.contributor.authorJeon, Hae-Gonko
dc.contributor.authorPark, Jaesikko
dc.contributor.authorChoe, Gyeongminko
dc.contributor.authorPark, Jinsunko
dc.contributor.authorBok, Yunsuko
dc.contributor.authorTai, Yu-Wingko
dc.contributor.authorKweon, In-Soko
dc.date.accessioned2019-02-20T04:56:54Z-
dc.date.available2019-02-20T04:56:54Z-
dc.date.created2017-12-21-
dc.date.issued2019-02-
dc.identifier.citationIEEE TRANSACTIONS ON PATTERN ANALYSIS AND MACHINE INTELLIGENCE, v.41, no.2, pp.297 - 310-
dc.identifier.issn0162-8828-
dc.identifier.urihttp://hdl.handle.net/10203/250237-
dc.description.abstractOne of the core applications of light field imaging is depth estimation. To acquire a depth map, existing approaches apply a single photo-consistency measure to an entire light field. However, this is not an optimal choice because of the non-uniform light field degradations produced by limitations in the hardware design. In this paper, we introduce a pipeline that automatically determines the best configuration for photo-consistency measurement, which leads to the most reliable depth label from the light field. We analyzed the practical factors affecting degradation in lenslet light field cameras, and designed a learning based framework that can retrieve the best cost measure and optimal depth label. To enhance the reliability of our method, we augmented an existing light field benchmark to simulate realistic source dependent noise, aberrations, and vignetting artifacts. The augmented dataset was used for the training and validation of the proposed approach. Our method was competitive with several state-of-the-art methods for the benchmark and real-world light field datasets.-
dc.languageEnglish-
dc.publisherIEEE COMPUTER SOC-
dc.titleDepth from a Light Field Image with Learning-based Matching Costs-
dc.typeArticle-
dc.identifier.wosid000456150600003-
dc.identifier.scopusid2-s2.0-85040938949-
dc.type.rimsART-
dc.citation.volume41-
dc.citation.issue2-
dc.citation.beginningpage297-
dc.citation.endingpage310-
dc.citation.publicationnameIEEE TRANSACTIONS ON PATTERN ANALYSIS AND MACHINE INTELLIGENCE-
dc.identifier.doi10.1109/TPAMI.2018.2794979-
dc.contributor.localauthorKweon, In-So-
dc.contributor.nonIdAuthorPark, Jaesik-
dc.contributor.nonIdAuthorBok, Yunsu-
dc.contributor.nonIdAuthorTai, Yu-Wing-
dc.description.isOpenAccessN-
dc.type.journalArticleArticle-
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