DC Field | Value | Language |
---|---|---|
dc.contributor.author | Kim, Young-You | ko |
dc.contributor.author | Lee, Jeong-Hwa | ko |
dc.contributor.author | Ahn, Eun-Jun | ko |
dc.contributor.author | Kim, Han-Jung | ko |
dc.date.accessioned | 2019-01-23T06:54:17Z | - |
dc.date.available | 2019-01-23T06:54:17Z | - |
dc.date.created | 2019-01-21 | - |
dc.date.issued | 2019-01 | - |
dc.identifier.citation | PHYSICA E-LOW-DIMENSIONAL SYSTEMS & NANOSTRUCTURES, v.105, pp.25 - 28 | - |
dc.identifier.issn | 1386-9477 | - |
dc.identifier.uri | http://hdl.handle.net/10203/250106 | - |
dc.description.abstract | In this paper, we propose a new strategy to improve the performance of nanoporous silicon (np-Si) layer-based optical gas sensors. For this, we fabricated the np-Si layer on a p(+)-type silicon substrate and modified the surface wettability of the np-Si layer with oxygen (O-2) plasma treatment. We then compared the changes in the reflectance spectra of the O-2 plasma-treated np-Si layer that had been exposed to various organic vapors with that of the untreated np-Si layer. The results by measuring the contact angle on the surface confirmed that the surface of the O-2 plasma-treated np-Si layer was hydrophilic. During the exposure to the organic vapors, there was a reversible red-shift phenomenon in the reflectance spectrum. This study confirmed that the red-shift can be attributed to the changes in the refractive index induced by the capillary condensation of the organic vapor within the nanopores of the np-Si layer. The changes in the reflectance spectra of the hydrophilic-treated np-Si layer were more noticeable than those in the untreated np-Si layer. These experimental results indicate that hydrophilic surface treatment can improve the selectivity and sensitivity of np-Si layer-based gas sensors. | - |
dc.language | English | - |
dc.publisher | ELSEVIER SCIENCE BV | - |
dc.title | Change in reflectance spectrum of nanoporous silicon by gas adsorption | - |
dc.type | Article | - |
dc.identifier.wosid | 000454899600005 | - |
dc.identifier.scopusid | 2-s2.0-85053482319 | - |
dc.type.rims | ART | - |
dc.citation.volume | 105 | - |
dc.citation.beginningpage | 25 | - |
dc.citation.endingpage | 28 | - |
dc.citation.publicationname | PHYSICA E-LOW-DIMENSIONAL SYSTEMS & NANOSTRUCTURES | - |
dc.identifier.doi | 10.1016/j.physe.2018.08.029 | - |
dc.contributor.nonIdAuthor | Kim, Young-You | - |
dc.contributor.nonIdAuthor | Lee, Jeong-Hwa | - |
dc.contributor.nonIdAuthor | Ahn, Eun-Jun | - |
dc.description.isOpenAccess | N | - |
dc.type.journalArticle | Article | - |
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