Browse "CS-Journal Papers(저널논문)" by Author Kim, Jinhan
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| Evaluating Surprise Adequacy for Deep Learning System Testing Kim, Jinhan; Feldt, Robert; Yoo, Shin, ACM TRANSACTIONS ON SOFTWARE ENGINEERING AND METHODOLOGY, v.32, no.2, 2023-04 |
| Learning test-mutant relationship for accurate fault localisation Kim, Jinhan; An, Gabin; Feldt, Robert; Yoo, Shin, INFORMATION AND SOFTWARE TECHNOLOGY, v.162, 2023-10 |
| Predictive Mutation Analysis via the Natural Language Channel in Source Code Kim, Jinhan; Jeon, Juyoung; Hong, Shin; Yoo, Shin, ACM TRANSACTIONS ON SOFTWARE ENGINEERING AND METHODOLOGY, v.31, no.4, pp.1 - 27, 2022-10 |
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