Showing results 1 to 5 of 5
A survey of race bug detection techniques for multithreaded programmes Hong, Shin; Kim, Moonzoo, SOFTWARE TESTING VERIFICATION & RELIABILITY, v.25, no.3, pp.191 - 217, 2015-05 |
Are concurrency coverage metrics effective for testing: a comprehensive empirical investigation Hong, Shin; Staats, Matt; Ahn, Jaemin; Kim, Moonzoo; Rothermel, Gregg, SOFTWARE TESTING VERIFICATION & RELIABILITY, v.25, no.4, pp.334 - 370, 2015-06 |
Effective pattern-driven concurrency bug detection for operating systems Hong, Shin; Kim, Moon-Zoo, JOURNAL OF SYSTEMS AND SOFTWARE, v.86, no.2, pp.377 - 388, 2013-02 |
MUSEUM: Debugging real-world multilingual programs using mutation analysis Hong, Shin; Kwak, Taehoon; Lee, Byeongcheol; Jeon, Yiru; Ko, Bongseok; Kim, YunHo; Kim, Moonzoo, Information and Software Technology, v.82, pp.80 - 95, 2017-02 |
Predictive Mutation Analysis via the Natural Language Channel in Source Code Kim, Jinhan; Jeon, Juyoung; Hong, Shin; Yoo, Shin, ACM TRANSACTIONS ON SOFTWARE ENGINEERING AND METHODOLOGY, v.31, no.4, pp.1 - 27, 2022-10 |
Discover