Showing results 1 to 3 of 3
Evaluating Surprise Adequacy for Deep Learning System Testing Kim, Jinhan; Feldt, Robert; Yoo, Shin, ACM TRANSACTIONS ON SOFTWARE ENGINEERING AND METHODOLOGY, v.32, no.2, 2023-04 |
Learning test-mutant relationship for accurate fault localisation Kim, Jinhan; An, Gabin; Feldt, Robert; Yoo, Shin, INFORMATION AND SOFTWARE TECHNOLOGY, v.162, 2023-10 |
Observation-based approximate dependency modeling and its use for program slicing Lee, Seongmin; Binkley, David; Feldt, Robert; Gold, Nicolas; Yoo, Shin, JOURNAL OF SYSTEMS AND SOFTWARE, v.179, pp.110988, 2021-09 |
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