DC Field | Value | Language |
---|---|---|
dc.contributor.author | Lim, Kyu Nam | - |
dc.contributor.author | Hong, Songcheol | - |
dc.contributor.author | Lee, Kwyro | - |
dc.date.accessioned | 2011-08-23T05:24:06Z | - |
dc.date.available | 2011-08-23T05:24:06Z | - |
dc.date.created | 2012-02-06 | - |
dc.date.issued | 1996 | - |
dc.identifier.citation | International Conference on Solid State Devices and Materials, v., no., pp.359 - 361 | - |
dc.identifier.uri | http://hdl.handle.net/10203/24972 | - |
dc.language | ENG | - |
dc.language.iso | en_US | en |
dc.title | Distribution of Trapped Electron and Hole in Thin SiO2 Film | - |
dc.type | Conference | - |
dc.type.rims | CONF | - |
dc.citation.beginningpage | 359 | - |
dc.citation.endingpage | 361 | - |
dc.citation.publicationname | International Conference on Solid State Devices and Materials | - |
dc.identifier.conferencecountry | Japan | - |
dc.identifier.conferencecountry | Japan | - |
dc.contributor.localauthor | Hong, Songcheol | - |
dc.contributor.localauthor | Lee, Kwyro | - |
dc.contributor.nonIdAuthor | Lim, Kyu Nam | - |
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