Distribution of Trapped Electron and Hole in Thin SiO2 Film

Cited 0 time in webofscience Cited 0 time in scopus
  • Hit : 242
  • Download : 2
Issue Date
1996
Language
ENG
Citation

International Conference on Solid State Devices and Materials, pp.359 - 361

URI
http://hdl.handle.net/10203/24972
Appears in Collection
EE-Conference Papers(학술회의논문)

qr_code

  • mendeley

    citeulike


rss_1.0 rss_2.0 atom_1.0