A study on the influence of electronic field on dark noise in SiPMs for low light detection

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Publisher
IEEE Nuclear Science Syposium and Medical Imaging Conference
Issue Date
2018-11-14
Language
English
Citation

IEEE Nuclear Science Syposium and Medical Imaging Conference

URI
http://hdl.handle.net/10203/248824
Appears in Collection
NE-Conference Papers(학술회의논문)
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