The Effects of X-ray Irradiation-induced damage on Reliability in mos stuructures
| DC Field | Value | Language |
|---|---|---|
| dc.contributor.author | Kim, Shi-ho | - |
| dc.contributor.author | Lee, Ho jun | - |
| dc.contributor.author | Han, Chul-hi | - |
| dc.contributor.author | Lee, Kwyro | - |
| dc.contributor.author | Choi, Sang soo | - |
| dc.contributor.author | Jeon, Young-jin | - |
| dc.contributor.author | Fabrizio, Enzo Di | - |
| dc.contributor.author | Gentili, Massimo | - |
| dc.date.accessioned | 2011-08-11T01:47:35Z | - |
| dc.date.available | 2011-08-11T01:47:35Z | - |
| dc.date.issued | 1994 | - |
| dc.identifier.citation | Solid-State Electronics | en |
| dc.identifier.uri | http://hdl.handle.net/10203/24849 | - |
| dc.language.iso | en_US | en |
| dc.publisher | Elsevier | en |
| dc.title | The Effects of X-ray Irradiation-induced damage on Reliability in mos stuructures | en |
| dc.type | Article | en |
- Appears in Collection
- EE-Journal Papers(저널논문)
- Files in This Item
- p51.pdf(842.04 kB)Download
Items in DSpace are protected by copyright, with all rights reserved, unless otherwise indicated.