Coherent, atomically thin transition-metal dichalcogenide superlattices with engineered strain

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dc.contributor.authorXie, Saienko
dc.contributor.authorTu, Lijieko
dc.contributor.authorHan, Yimoko
dc.contributor.authorHuang, Lujieko
dc.contributor.authorKang, Kibumko
dc.contributor.authorLao, Ka Unko
dc.contributor.authorPoddar, Preetiko
dc.contributor.authorPark, Chibeomko
dc.contributor.authorMuller, David A.ko
dc.contributor.authorDiStasio, Robert A., Jr.ko
dc.contributor.authorPark, Jiwoongko
dc.date.accessioned2018-12-20T06:53:14Z-
dc.date.available2018-12-20T06:53:14Z-
dc.date.created2018-12-12-
dc.date.created2018-12-12-
dc.date.created2018-12-12-
dc.date.issued2018-03-
dc.identifier.citationSCIENCE, v.359, no.6380, pp.1131 - 1135-
dc.identifier.issn0036-8075-
dc.identifier.urihttp://hdl.handle.net/10203/248328-
dc.description.abstractEpitaxy forms the basis of modern electronics and optoelectronics. We report coherent atomically thin superlattices in which different transition metal dichalcogenide monolayers-despite large lattice mismatches-are repeated and laterally integrated without dislocations within the monolayer plane. Grown by an omnidirectional epitaxy, these superlattices display fully matched lattice constants across heterointerfaces while maintaining an isotropic lattice structure and triangular symmetry. This strong epitaxial strain is precisely engineered via the nanoscale supercell dimensions, thereby enabling broad tuning of the optical properties and producing photoluminescence peak shifts as large as 250 millielectron volts. We present theoretical models to explain this coherent growth and the energetic interplay governing the ripple formation in these strained monolayers. Such coherent superlattices provide building blocks with targeted functionalities at the atomically thin limit.-
dc.languageEnglish-
dc.publisherAMER ASSOC ADVANCEMENT SCIENCE-
dc.titleCoherent, atomically thin transition-metal dichalcogenide superlattices with engineered strain-
dc.typeArticle-
dc.identifier.wosid000426835900040-
dc.identifier.scopusid2-s2.0-85043240569-
dc.type.rimsART-
dc.citation.volume359-
dc.citation.issue6380-
dc.citation.beginningpage1131-
dc.citation.endingpage1135-
dc.citation.publicationnameSCIENCE-
dc.identifier.doi10.1126/science.aao5360-
dc.contributor.localauthorKang, Kibum-
dc.contributor.nonIdAuthorXie, Saien-
dc.contributor.nonIdAuthorTu, Lijie-
dc.contributor.nonIdAuthorHan, Yimo-
dc.contributor.nonIdAuthorHuang, Lujie-
dc.contributor.nonIdAuthorLao, Ka Un-
dc.contributor.nonIdAuthorPoddar, Preeti-
dc.contributor.nonIdAuthorPark, Chibeom-
dc.contributor.nonIdAuthorMuller, David A.-
dc.contributor.nonIdAuthorDiStasio, Robert A., Jr.-
dc.contributor.nonIdAuthorPark, Jiwoong-
dc.description.isOpenAccessN-
dc.type.journalArticleArticle-
dc.subject.keywordPlusDER-WAALS HETEROSTRUCTURES-
dc.subject.keywordPlusLAYER MOS2-
dc.subject.keywordPlusLATERAL HETEROSTRUCTURES-
dc.subject.keywordPlusELECTRONIC-PROPERTIES-
dc.subject.keywordPlusMOLYBDENUM-DISULFIDE-
dc.subject.keywordPlusMISFIT DISLOCATIONS-
dc.subject.keywordPlusEPITAXIAL-GROWTH-
dc.subject.keywordPlusPIEZOELECTRICITY-
dc.subject.keywordPlusHETEROJUNCTIONS-
dc.subject.keywordPlusOPTOELECTRONICS-
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