A 114-aFrms-Resolution 46-NF/10-MΩ-Range Digital-Intensive Reconfigurable RC-to-Digital Converter with Parasitic-Insensitive Femto-Farad Baseline Sensing

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This paper presents a digital-intensive dynamically reconfigurable RC-to-digital converter with an input range of 46 nF/10 MΩ, suitable for reading out R or C sensors in a time-interleaved way. Its reconfigurability also allows parasitic-insensitive sensing of femto-farad baseline capacitances. Implemented in a 0.18-μm CMOS process, it uses a swing-boosted period-modulation (SB-PM) frontend, achieving a capacitance resolution of 114 aF
Publisher
Institute of Electrical and Electronics Engineers Inc.
Issue Date
2018-06-20
Language
English
Citation

32nd IEEE Symposium on VLSI Circuits, VLSI Circuits 2018, pp.157 - 158

DOI
10.1109/VLSIC.2018.8502332
URI
http://hdl.handle.net/10203/247461
Appears in Collection
EE-Conference Papers(학술회의논문)
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