Origin of thickness dependence of structural phase transition temperatures in highly strained BiFeO3 thin films

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Two structural phase transitions are investigated in highly strained BiFeO3 thin films as a function of film thickness and temperature via synchrotron x-ray diffraction. Both transition temperatures (upon heating: monoclinic MC to monoclinic MA to tetragonal) decrease as the film becomes thinner. A film-substrate interface layer, evidenced by half-order peaks, contributes to this behavior, but at larger thicknesses (above a few nanometers), the temperature dependence results from electrostatic considerations akin to size effects in ferroelectric phase transitions, but observed here for structural phase transitions within the ferroelectric phase. For ultra-thin films, the tetragonal structure is stable to low temperatures. (C) 2016 Author(s).
Publisher
AMER INST PHYSICS
Issue Date
2016-03
Language
English
Article Type
Article
Citation

APL MATERIALS, v.4, no.3, pp.036106

ISSN
2166-532X
DOI
10.1063/1.4944749
URI
http://hdl.handle.net/10203/246189
Appears in Collection
PH-Journal Papers(저널논문)
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