NEW APPROACH FOR MODELING OF CURRENT DEGRADATION IN HOT-ELECTRON DAMAGED LDD NMOSFETS
| DC Field | Value | Language |
|---|---|---|
| dc.contributor.author | YTTERDAL, T | ko |
| dc.contributor.author | KIM, SH | ko |
| dc.contributor.author | Lee, Kwyro | ko |
| dc.contributor.author | FJELDLY, TA | ko |
| dc.date.accessioned | 2011-07-13T07:50:23Z | - |
| dc.date.available | 2011-07-13T07:50:23Z | - |
| dc.date.created | 2012-02-06 | - |
| dc.date.created | 2012-02-06 | - |
| dc.date.issued | 1995-02 | - |
| dc.identifier.citation | IEEE TRANSACTIONS ON ELECTRON DEVICES, v.42, no.2, pp.362 - 365 | - |
| dc.identifier.issn | 0018-9383 | - |
| dc.identifier.uri | http://hdl.handle.net/10203/24615 | - |
| dc.description.abstract | An analytical model describing current degradation in hot-electron damaged LDD NMOSFETs is proposed. The basic idea of the model is that the drain current degradation can be explained in terms of an increase in the parasitic resistance only. Good agreement with measured data over at least three decades of stress time is obtained with our model. | - |
| dc.description.sponsorship | This work has been supported by the Research Council of Norway and Hyundai Electronics Industries Co.Ltd. The authors thank K.Min and S.Hong for valuable discussions during this work. | en |
| dc.language | English | - |
| dc.language.iso | en_US | en |
| dc.publisher | IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC | - |
| dc.subject | MOSFETS | - |
| dc.title | NEW APPROACH FOR MODELING OF CURRENT DEGRADATION IN HOT-ELECTRON DAMAGED LDD NMOSFETS | - |
| dc.type | Article | - |
| dc.identifier.wosid | A1995QD76800026 | - |
| dc.identifier.scopusid | 2-s2.0-0029247259 | - |
| dc.type.rims | ART | - |
| dc.citation.volume | 42 | - |
| dc.citation.issue | 2 | - |
| dc.citation.beginningpage | 362 | - |
| dc.citation.endingpage | 365 | - |
| dc.citation.publicationname | IEEE TRANSACTIONS ON ELECTRON DEVICES | - |
| dc.embargo.liftdate | 9999-12-31 | - |
| dc.embargo.terms | 9999-12-31 | - |
| dc.contributor.localauthor | Lee, Kwyro | - |
| dc.contributor.nonIdAuthor | YTTERDAL, T | - |
| dc.contributor.nonIdAuthor | KIM, SH | - |
| dc.contributor.nonIdAuthor | FJELDLY, TA | - |
| dc.type.journalArticle | Note | - |
| dc.subject.keywordPlus | MOSFETS | - |
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