Spray-Coated Liquid Metal Reflectors for Transparent Hydrogel Atomic Force Microscope Cantilevers

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dc.contributor.authorKim, Kwangseokko
dc.contributor.authorKim, Seokbeomko
dc.contributor.authorKim, Taehongko
dc.contributor.authorKim, Wonjungko
dc.contributor.authorLee, Jungchulko
dc.date.accessioned2018-09-18T05:53:43Z-
dc.date.available2018-09-18T05:53:43Z-
dc.date.created2018-08-21-
dc.date.created2018-08-21-
dc.date.issued2016-10-
dc.identifier.citationJOURNAL OF MICROELECTROMECHANICAL SYSTEMS, v.25, no.5, pp.848 - 850-
dc.identifier.issn1057-7157-
dc.identifier.urihttp://hdl.handle.net/10203/245452-
dc.description.abstractThis letter reports optical-lever detection with spray-coated liquid metal reflectors for transparent hydrogel atomic force microscope (AFM) cantilevers. Eutectic gallium-indium (EGaIn) filled in an air brush was locally sprayed over poly(ethylene) glycol-diacrylate (PEG-DA) AFM cantilevers with a shadow mask. Oxygen plasma treatment for bare hydrogel cantilevers prior to the EGaIn spray was shown to improve the wetting characteristics between EGaIn and PEG-DA, thus enabled relatively thin coating of similar to 800 nm within similar to 100 ms. PEG-DA AFM cantilevers coated with EGaIn were underwent mechanical characterization, and were employed for AFM imaging in both air and deionized (DI) water. Except the reflectivity degraded down to 40% of the initial value after 1-h dwell in DI water, their overall performance was comparable with those of PEG-DA AFM cantilevers with solid metal reflectors.-
dc.languageEnglish-
dc.publisherIEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC-
dc.titleSpray-Coated Liquid Metal Reflectors for Transparent Hydrogel Atomic Force Microscope Cantilevers-
dc.typeArticle-
dc.identifier.wosid000389897800004-
dc.identifier.scopusid2-s2.0-84979787900-
dc.type.rimsART-
dc.citation.volume25-
dc.citation.issue5-
dc.citation.beginningpage848-
dc.citation.endingpage850-
dc.citation.publicationnameJOURNAL OF MICROELECTROMECHANICAL SYSTEMS-
dc.identifier.doi10.1109/JMEMS.2016.2589539-
dc.contributor.localauthorLee, Jungchul-
dc.contributor.nonIdAuthorKim, Kwangseok-
dc.contributor.nonIdAuthorKim, Seokbeom-
dc.contributor.nonIdAuthorKim, Taehong-
dc.contributor.nonIdAuthorKim, Wonjung-
dc.description.isOpenAccessN-
dc.type.journalArticleArticle-
dc.subject.keywordAuthorAtomic force microscope (AFM)-
dc.subject.keywordAuthorcantilever-
dc.subject.keywordAuthoreutectic gallium indium (EGaIn)-
dc.subject.keywordAuthorhydrogel-
dc.subject.keywordAuthorliquid metal-
dc.subject.keywordAuthormirror-
dc.subject.keywordAuthorpoly(ethylene) glycol-diacrylate (PEG-DA)-
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