DC Field | Value | Language |
---|---|---|
dc.contributor.author | Kim, Kwangseok | ko |
dc.contributor.author | Kim, Seokbeom | ko |
dc.contributor.author | Kim, Taehong | ko |
dc.contributor.author | Kim, Wonjung | ko |
dc.contributor.author | Lee, Jungchul | ko |
dc.date.accessioned | 2018-09-18T05:53:43Z | - |
dc.date.available | 2018-09-18T05:53:43Z | - |
dc.date.created | 2018-08-21 | - |
dc.date.created | 2018-08-21 | - |
dc.date.issued | 2016-10 | - |
dc.identifier.citation | JOURNAL OF MICROELECTROMECHANICAL SYSTEMS, v.25, no.5, pp.848 - 850 | - |
dc.identifier.issn | 1057-7157 | - |
dc.identifier.uri | http://hdl.handle.net/10203/245452 | - |
dc.description.abstract | This letter reports optical-lever detection with spray-coated liquid metal reflectors for transparent hydrogel atomic force microscope (AFM) cantilevers. Eutectic gallium-indium (EGaIn) filled in an air brush was locally sprayed over poly(ethylene) glycol-diacrylate (PEG-DA) AFM cantilevers with a shadow mask. Oxygen plasma treatment for bare hydrogel cantilevers prior to the EGaIn spray was shown to improve the wetting characteristics between EGaIn and PEG-DA, thus enabled relatively thin coating of similar to 800 nm within similar to 100 ms. PEG-DA AFM cantilevers coated with EGaIn were underwent mechanical characterization, and were employed for AFM imaging in both air and deionized (DI) water. Except the reflectivity degraded down to 40% of the initial value after 1-h dwell in DI water, their overall performance was comparable with those of PEG-DA AFM cantilevers with solid metal reflectors. | - |
dc.language | English | - |
dc.publisher | IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC | - |
dc.title | Spray-Coated Liquid Metal Reflectors for Transparent Hydrogel Atomic Force Microscope Cantilevers | - |
dc.type | Article | - |
dc.identifier.wosid | 000389897800004 | - |
dc.identifier.scopusid | 2-s2.0-84979787900 | - |
dc.type.rims | ART | - |
dc.citation.volume | 25 | - |
dc.citation.issue | 5 | - |
dc.citation.beginningpage | 848 | - |
dc.citation.endingpage | 850 | - |
dc.citation.publicationname | JOURNAL OF MICROELECTROMECHANICAL SYSTEMS | - |
dc.identifier.doi | 10.1109/JMEMS.2016.2589539 | - |
dc.contributor.localauthor | Lee, Jungchul | - |
dc.contributor.nonIdAuthor | Kim, Kwangseok | - |
dc.contributor.nonIdAuthor | Kim, Seokbeom | - |
dc.contributor.nonIdAuthor | Kim, Taehong | - |
dc.contributor.nonIdAuthor | Kim, Wonjung | - |
dc.description.isOpenAccess | N | - |
dc.type.journalArticle | Article | - |
dc.subject.keywordAuthor | Atomic force microscope (AFM) | - |
dc.subject.keywordAuthor | cantilever | - |
dc.subject.keywordAuthor | eutectic gallium indium (EGaIn) | - |
dc.subject.keywordAuthor | hydrogel | - |
dc.subject.keywordAuthor | liquid metal | - |
dc.subject.keywordAuthor | mirror | - |
dc.subject.keywordAuthor | poly(ethylene) glycol-diacrylate (PEG-DA) | - |
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