High-quality depth map up-sampling robust to edge noise of range sensors

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dc.contributor.authorKim, Daeyoungko
dc.contributor.authorYoon, Kuk-Jinko
dc.date.accessioned2018-08-20T08:00:04Z-
dc.date.available2018-08-20T08:00:04Z-
dc.date.created2018-08-08-
dc.date.issued2012-10-01-
dc.identifier.citation2012 19th IEEE International Conference on Image Processing, pp.553 - 556-
dc.identifier.urihttp://hdl.handle.net/10203/244932-
dc.description.abstractA new method to up-sample low-resolution depth maps to high quality and high resolution is proposed. Range sensors such as time-of-flight cameras yield low-resolution depth maps and the output includes heavy noise at the edges of objects. Recently, many techniques have been proposed to up-sample low-resolution depth maps. However, there is no effective countermeasure to the edge noise problem. The proposed up-sampling method is based on Markov random fields and addresses this edge noise using newly designed confidence weights. The performance of our method is evaluated using error rate and mean absolute error through comparison with existing methods, and results show that the proposed method outperforms conventional methods. © 2012 IEEE.-
dc.languageEnglish-
dc.publisherIEEE Signal Processing Society-
dc.titleHigh-quality depth map up-sampling robust to edge noise of range sensors-
dc.typeConference-
dc.type.rimsCONF-
dc.citation.beginningpage553-
dc.citation.endingpage556-
dc.citation.publicationname2012 19th IEEE International Conference on Image Processing-
dc.identifier.conferencecountryUS-
dc.identifier.conferencelocationLake Buena Vista, Orlando-
dc.identifier.doi10.1109/ICIP.2012.6466919-
dc.contributor.localauthorYoon, Kuk-Jin-
dc.contributor.nonIdAuthorKim, Daeyoung-
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ME-Conference Papers(학술회의논문)
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