Recap of the 23rd Asia and South Pacific Design Automation Conference (ASP-DAC)

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dc.contributor.authorShin, Youngsooko
dc.date.accessioned2018-06-19T08:28:59Z-
dc.date.available2018-06-19T08:28:59Z-
dc.date.created2018-06-18-
dc.date.created2018-06-18-
dc.date.created2018-06-18-
dc.date.created2018-06-18-
dc.date.issued2018-05-
dc.identifier.citationIEEE DESIGN & TEST, v.35, no.3, pp.100 - 101-
dc.identifier.issn2168-2356-
dc.identifier.urihttp://hdl.handle.net/10203/242619-
dc.description.abstractThe 23rd Asia and South Pacific Design Automation Conference (ASP-DAC) was held at the International Convention Center, Jeju Island, South Korea, on 22–25 January 2018. ASP-DAC was founded in 1995 and has continuously offered opportunity for the researchers around Asia and South Pacific regions to communicate with each other and to get exposed to the advanced and recent technologies. This year’s event was sponsored by ACM Special Interest Group on Design Automation (SIGDA), the IEEE Circuits and Systems Society, and the IEEE Council on Electronic Design Automation. We also had two Japanese organizations, Institute of Electronics, Information and Communication Engineers and Information Processing Society of Japan, which supported the conference. We were very fortunate to have a number of corporate sponsors including Cadence, SK Hynix, Mentor, Synopsys, Entasys, Baum, and Silvaco. The conference was attended by 373 people, which is similar to when the conference was held in Chiba, Japan, last year; the largest number of attendees was from South Korea, followed by the United States, Taiwan, China, Japan, Hong Kong, and Germany.-
dc.languageEnglish-
dc.publisherIEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC-
dc.titleRecap of the 23rd Asia and South Pacific Design Automation Conference (ASP-DAC)-
dc.typeArticle-
dc.identifier.wosid000433367900013-
dc.identifier.scopusid2-s2.0-85048198816-
dc.type.rimsART-
dc.citation.volume35-
dc.citation.issue3-
dc.citation.beginningpage100-
dc.citation.endingpage101-
dc.citation.publicationnameIEEE DESIGN & TEST-
dc.identifier.doi10.1109/MDAT.2018.2817565-
dc.contributor.localauthorShin, Youngsoo-
dc.description.isOpenAccessN-
dc.type.journalArticleEditorial Material-
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EE-Journal Papers(저널논문)
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