Measurements of polarization-dependent angle-resolved light scattering from individual microscopic samples using Fourier transform light scattering

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dc.contributor.authorJung, Jae Hwangko
dc.contributor.authorKim, Jinhyungko
dc.contributor.authorSeo, Min-Kyoko
dc.contributor.authorPark, YongKeunko
dc.date.accessioned2018-04-24T05:08:19Z-
dc.date.available2018-04-24T05:08:19Z-
dc.date.created2018-04-09-
dc.date.created2018-04-09-
dc.date.created2018-04-09-
dc.date.created2018-04-09-
dc.date.issued2018-03-
dc.identifier.citationOPTICS EXPRESS, v.26, no.6, pp.7701 - 7711-
dc.identifier.issn1094-4087-
dc.identifier.urihttp://hdl.handle.net/10203/241331-
dc.description.abstractWe present a method to measure the vector-field light scattering of individual microscopic objects. The polarization-dependent optical field images are measured with quantitative phase imaging at the sample plane, and then numerically propagated to the far-field plane. This approach allows the two-dimensional polarization-dependent angle-resolved light scattered patterns from individual object to be obtained with high precision and sensitivity. Using this method, we present the measurements of the polarization-dependent light scattering of a liquid crystal droplet and individual silver nanowires over scattering angles of 50 degrees. In addition, the spectroscopic extension of the polarization-dependent angle-resolved light scattering is demonstrated using wavelength-scanning illumination. (C) 2018 Optical Society of America under the terms of the OSA Open Access Publishing Agreement-
dc.languageEnglish-
dc.publisherOPTICAL SOC AMER-
dc.subjectDIGITAL HOLOGRAPHIC MICROSCOPY-
dc.subjectJONES MATRIX-
dc.subjectFLUORESCENCE MICROSCOPY-
dc.subjectSENSITIVE MATERIALS-
dc.subjectDIFFRACTION PHASE-
dc.subjectCELL-
dc.subjectSPECTROSCOPY-
dc.subjectDISEASE-
dc.subjectTOMOGRAPHY-
dc.subjectCRYSTALS-
dc.titleMeasurements of polarization-dependent angle-resolved light scattering from individual microscopic samples using Fourier transform light scattering-
dc.typeArticle-
dc.identifier.wosid000427900400122-
dc.identifier.scopusid2-s2.0-85044191908-
dc.type.rimsART-
dc.citation.volume26-
dc.citation.issue6-
dc.citation.beginningpage7701-
dc.citation.endingpage7711-
dc.citation.publicationnameOPTICS EXPRESS-
dc.identifier.doi10.1364/OE.26.007701-
dc.contributor.localauthorSeo, Min-Kyo-
dc.contributor.localauthorPark, YongKeun-
dc.description.isOpenAccessY-
dc.type.journalArticleArticle-
dc.subject.keywordPlusDIGITAL HOLOGRAPHIC MICROSCOPY-
dc.subject.keywordPlusJONES MATRIX-
dc.subject.keywordPlusFLUORESCENCE MICROSCOPY-
dc.subject.keywordPlusSENSITIVE MATERIALS-
dc.subject.keywordPlusDIFFRACTION PHASE-
dc.subject.keywordPlusCELL-
dc.subject.keywordPlusSPECTROSCOPY-
dc.subject.keywordPlusDISEASE-
dc.subject.keywordPlusTOMOGRAPHY-
dc.subject.keywordPlusCRYSTALS-
dc.subject.keywordPlusDIGITAL HOLOGRAPHIC MICROSCOPY-
dc.subject.keywordPlusJONES MATRIX-
dc.subject.keywordPlusFLUORESCENCE MICROSCOPY-
dc.subject.keywordPlusSENSITIVE MATERIALS-
dc.subject.keywordPlusDIFFRACTION PHASE-
dc.subject.keywordPlusCELL-
dc.subject.keywordPlusSPECTROSCOPY-
dc.subject.keywordPlusDISEASE-
dc.subject.keywordPlusTOMOGRAPHY-
dc.subject.keywordPlusCRYSTALS-
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