Non-Destructive Measurement of Graphene Defects using Induced Voltage
| DC Field | Value | Language |
|---|---|---|
| dc.contributor.author | Kang, Sumin | ko |
| dc.contributor.author | Yoon, Taeshik | ko |
| dc.contributor.author | KANG, TAE YEOB | ko |
| dc.contributor.author | Kim, Taek-Soo | ko |
| dc.date.accessioned | 2018-02-21T04:21:42Z | - |
| dc.date.available | 2018-02-21T04:21:42Z | - |
| dc.date.created | 2017-12-13 | - |
| dc.date.issued | 2017-07-24 | - |
| dc.identifier.citation | Carbon 2017 | - |
| dc.identifier.uri | http://hdl.handle.net/10203/239675 | - |
| dc.language | English | - |
| dc.publisher | Royal Australian Chemical Institute | - |
| dc.title | Non-Destructive Measurement of Graphene Defects using Induced Voltage | - |
| dc.type | Conference | - |
| dc.type.rims | CONF | - |
| dc.citation.publicationname | Carbon 2017 | - |
| dc.identifier.conferencecountry | AT | - |
| dc.identifier.conferencelocation | Melbourne Convention and Exhibition Centre | - |
| dc.contributor.localauthor | Kim, Taek-Soo | - |
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