(Poster) Nanoscopic Optical Properties of InGaN/GaN Quantum Wells with V-Pit Using Near-Field Scaning Optical Microscopy and Correlation
| DC Field | Value | Language |
|---|---|---|
| dc.contributor.author | Kim, Min Kwan | ko |
| dc.contributor.author | Cho, Yong-Hoon | ko |
| dc.contributor.author | Choi, Sunghan | ko |
| dc.contributor.author | Lee, Joo-Hyung | ko |
| dc.contributor.author | Park, ChungHyun | ko |
| dc.contributor.author | Chung, Tae-Hoon | ko |
| dc.contributor.author | Baek, Hyeob | ko |
| dc.date.accessioned | 2018-01-30T04:47:26Z | - |
| dc.date.available | 2018-01-30T04:47:26Z | - |
| dc.date.created | 2017-12-20 | - |
| dc.date.issued | 2017-07-26 | - |
| dc.identifier.citation | 12th International conference on Niride semiconductors | - |
| dc.identifier.uri | http://hdl.handle.net/10203/239204 | - |
| dc.language | English | - |
| dc.publisher | European materials research society | - |
| dc.title | (Poster) Nanoscopic Optical Properties of InGaN/GaN Quantum Wells with V-Pit Using Near-Field Scaning Optical Microscopy and Correlation | - |
| dc.type | Conference | - |
| dc.type.rims | CONF | - |
| dc.citation.publicationname | 12th International conference on Niride semiconductors | - |
| dc.identifier.conferencecountry | FR | - |
| dc.identifier.conferencelocation | Strasbourg | - |
| dc.contributor.localauthor | Cho, Yong-Hoon | - |
| dc.contributor.nonIdAuthor | Lee, Joo-Hyung | - |
| dc.contributor.nonIdAuthor | Park, ChungHyun | - |
| dc.contributor.nonIdAuthor | Chung, Tae-Hoon | - |
| dc.contributor.nonIdAuthor | Baek, Hyeob | - |
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