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3-D MEMS scanning system for dual-axis confocal microendoscopy

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Jeong, Jae-Woongresearcher / Mandella, Michael J. / Kino, Gordon S. / Contag, Christopher H. / Solgaard, Olav
Publisher
IEEE
Issue Date
2011-08-10
Language
English
Citation

International Conference on Optical MEMS and Nanophotonics

URI
http://hdl.handle.net/10203/238733
Appears in Collection
EE-Conference Papers(학술회의논문)
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