Uniform crack formation assisted by stretch mark patterning for strain sensor application
| DC Field | Value | Language |
|---|---|---|
| dc.contributor.author | Hansol Jang | ko |
| dc.contributor.author | Lee, Wonhee | ko |
| dc.date.accessioned | 2018-01-22T02:12:47Z | - |
| dc.date.available | 2018-01-22T02:12:47Z | - |
| dc.date.created | 2017-12-21 | - |
| dc.date.issued | 2017-12-08 | - |
| dc.identifier.citation | ICAMD 2017 | - |
| dc.identifier.uri | http://hdl.handle.net/10203/237248 | - |
| dc.language | English | - |
| dc.publisher | Korean Physical Society | - |
| dc.title | Uniform crack formation assisted by stretch mark patterning for strain sensor application | - |
| dc.type | Conference | - |
| dc.type.rims | CONF | - |
| dc.citation.publicationname | ICAMD 2017 | - |
| dc.identifier.conferencecountry | KO | - |
| dc.identifier.conferencelocation | Ramada Plaza Jeju Hotel, Jeju Island | - |
| dc.contributor.localauthor | Lee, Wonhee | - |
| dc.contributor.nonIdAuthor | Hansol Jang | - |
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