DC Field | Value | Language |
---|---|---|
dc.contributor.author | 권대갑 | ko |
dc.date.accessioned | 2017-12-21T00:52:19Z | - |
dc.date.available | 2017-12-21T00:52:19Z | - |
dc.date.issued | 2006-04-11 | - |
dc.identifier.uri | http://hdl.handle.net/10203/237024 | - |
dc.description.abstract | A 3-axis straight-line motion stage and a sample test device using the same for supporting a predetermined sample, and comprising X-axis, Y-axis and Z-axis stages for moving the sample independently and precisely in the direction of the X-axis, the Y-axis or the Z-axis of rectangular coordinates. The 3-axis straight-line motion stage comprises a bottom plate 40 having a predetermined area and thickness; a X-axis stage 10 fixed in a reference area RR of the bottom plate 40 for moving in the direction of the X-axis a first X area RX1 positioned from the reference RR to the direction of the X-axis; a Y-axis stage 20 positioned within the first X area RX1 and fixed in a second X area RX2, which is located within the first X area RX1 for moving in the direction of the Y-axis a second Y area RY1 positioned from the second X area to the direction of the Y-axis; and a Z-axis stage 30 fixed in the second Y area RY2, which is located within the first Y area RY1 and supporting a predetermined sample for moving the sample in the direction of the Z-axis. | - |
dc.title | 3-axis straight-line motion stage and sample test device using the same | - |
dc.type | Patent | - |
dc.type.rims | PAT | - |
dc.contributor.localauthor | 권대갑 | - |
dc.contributor.assignee | Korea Advanced Institute of Science and Technology | - |
dc.identifier.iprsType | 특허 | - |
dc.identifier.patentApplicationNumber | 10726759 | - |
dc.identifier.patentRegistrationNumber | 7,024,925 | - |
dc.date.application | 2003-12-03 | - |
dc.date.registration | 2006-04-11 | - |
dc.publisher.country | US | - |
Items in DSpace are protected by copyright, with all rights reserved, unless otherwise indicated.