Browse "RIMS Collection" by Subject negative bias illumination stress (NBIS)
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| Effects of Fluorine Doping on the Electrical Performance of ZnON Thin-Film Transistors Kim, Hyoung-Do; Kim, Jong Heon; Park, Kyung; Kim, Jung Hyun; Park, Jozeph; Kim, Yong Joo; Kim, Hyun-Suk, ACS APPLIED MATERIALS & INTERFACES, v.9, no.29, pp.24688 - 24695, 2017-07 |
| Highly Stable Thin-Film Transistors Based on Indium Oxynitride Semiconductor Kim, Hyoung-Do; Kim, Jong Heon; Park, Kyung; Park, Yun Chang; Kim, Sunkook; Kim, Yong Joo; Park, Jozeph; et al, ACS APPLIED MATERIALS & INTERFACES, v.10, no.18, pp.15873 - 15879, 2018-05 |
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