Browse "RIMS Collection" by Subject RANDOM TELEGRAPH NOISE

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EFFECTS OF PLASMA CHARGING DAMAGE ON THE NOISE PERFORMANCE OF THIN-OXIDE MOSFETS

MA, ZJ; Shin, Hyung-Cheol; KO, PK; HU, C, IEEE ELECTRON DEVICE LETTERS, v.15, no.6, pp.224 - 226, 1994-06

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