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Calibration-free real-time organic film thickness monitoring technique by reflected X-Ray fluorescence and compton scattering measurement

Park, Junghwan; Choi, Yong Suk; Kim, Junhyuck; Lee, Jeongmook; Kim, Tae Jun; Youn, Young-Sang; Lim, Sang Ho; et al, NUCLEAR ENGINEERING AND TECHNOLOGY, v.53, no.4, pp.1297 - 1303, 2021-04

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