Browse "RIMS Collection" by Subject Negative bias illumination stress (NBIS)
Showing results 1 to 3 of 3
| A study on the competition between bias-induced charge trapping and light-induced instability in In-Ga-Zn-O thin-film transistors Park, Jozeph; Nguyen Dinh Trung; Kim, Yang Soo; Kim, Jong Heon; Park, Kyung; Kim, Hyun-Suk, JOURNAL OF ELECTROCERAMICS, v.36, no.1-4, pp.135 - 140, 2016-06 |
| Flexible In-Ga-Zn-O thin-film transistors fabricated on polyimide substrates and mechanically induced instability under negative bias illumination stress Park, Jozeph; Kim, Chang-Sun; Ahn, Byung Du; Ryu, Hojun; Kim, Hyun-Suk, JOURNAL OF ELECTROCERAMICS, v.35, no.1-4, pp.106 - 110, 2015-12 |
| The effects of active layer thickness and annealing conditions on the electrical performance of ZnON thin-film transistors Park, Jozeph; Kim, Yang Soo; Kim, Jong Heon; Park, Kyung; Park, Yun Chang; Kim, Hyun-Suk, JOURNAL OF ALLOYS AND COMPOUNDS, v.688, pp.666 - 671, 2016-12 |
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