Browse "RIMS Collection" by Subject Nanowire
Showing results 1 to 2 of 2
| Barrier Height Measurement of Metal Contacts to Si Nanowires Using Internal Photoemission of Hot Carriers Yoon, KunHo; Hyun, Jerome K.; Connell, Justin G.; Amit, Iddo; Rosenwaks, Yossi; Lauhon, Lincoln J., NANO LETTERS, v.13, no.12, pp.6183 - 6188, 2013-12 |
The Characteristics of Seebeck Coefficient in Silicon Nanowires Manufactured by CMOS Compatible Process Jang M.; Park Y.; Jun M.; Hyun Y.; Choi S.-J.; Zyung T., NANOSCALE RESEARCH LETTERS, v.5, no.10, pp.1654 - 1657, 2010 |
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