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A Study on the Degradation of In-Ga-Zn-O Thin-Film Transistors Under Current Stress by Local Variations in Density of States and Trapped Charge Distribution

Choi, Sungju; Kim, Hyeongjung; Jo, Chunhyung; Kim, Hyun-Suk; Choi, Sung-Jin; Kim, Dong Myong; Park, Jozeph; et al, IEEE ELECTRON DEVICE LETTERS, v.36, no.7, pp.690 - 692, 2015-07

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