Browse "RIMS Collection" by Subject JUNCTION LEAKAGE CURRENT
Showing results 1 to 1 of 1
| A NOVEL LOCAL OXIDATION OF SILICON (LOCOS)-TYPE ISOLATION TECHNOLOGY FREE OF THE FIELD OXIDE THINNING EFFECT PARK, TS; AHN, SJ; AHN, ST, JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES & REVIEW PAPERS, v.33, no.1B, pp.435 - 439, 1994-01 |
Discover
Type
- 4,798 Article
- 3,515 Conference
- 1,492 Patent
Open Access
- 223 OA Article
Date issued
- 1,308 2020 - 2024
- 2,942 2010 - 2019
- 2,339 2000 - 2009
- 1,846 1990 - 1999
- 579 1980 - 1989
- 3 1964 - 1969