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Showing results 1 to 4 of 4

1
A study on the competition between bias-induced charge trapping and light-induced instability in In-Ga-Zn-O thin-film transistors

Park, Jozeph; Nguyen Dinh Trung; Kim, Yang Soo; Kim, Jong Heon; Park, Kyung; Kim, Hyun-Suk, JOURNAL OF ELECTROCERAMICS, v.36, no.1-4, pp.135 - 140, 2016-06

2
A Study on the Degradation of In-Ga-Zn-O Thin-Film Transistors Under Current Stress by Local Variations in Density of States and Trapped Charge Distribution

Choi, Sungju; Kim, Hyeongjung; Jo, Chunhyung; Kim, Hyun-Suk; Choi, Sung-Jin; Kim, Dong Myong; Park, Jozeph; et al, IEEE ELECTRON DEVICE LETTERS, v.36, no.7, pp.690 - 692, 2015-07

3
The Effect of Gate and Drain Fields on the Competition Between Donor-Like State Creation and Local Electron Trapping in In-Ga-Zn-O Thin Film Transistors Under Current Stress

Choi, Sungju; Kim, Hyeongjung; Jo, Chunhyung; Kim, Hyun-Suk; Choi, Sung-Jin; Kim, Dong Myong; Park, Jozeph; et al, IEEE ELECTRON DEVICE LETTERS, v.36, no.12, pp.1336 - 1339, 2015-12

4
The effects of active layer thickness and annealing conditions on the electrical performance of ZnON thin-film transistors

Park, Jozeph; Kim, Yang Soo; Kim, Jong Heon; Park, Kyung; Park, Yun Chang; Kim, Hyun-Suk, JOURNAL OF ALLOYS AND COMPOUNDS, v.688, pp.666 - 671, 2016-12

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