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A study on the competition between bias-induced charge trapping and light-induced instability in In-Ga-Zn-O thin-film transistors

Park, Jozeph; Nguyen Dinh Trung; Kim, Yang Soo; Kim, Jong Heon; Park, Kyung; Kim, Hyun-Suk, JOURNAL OF ELECTROCERAMICS, v.36, no.1-4, pp.135 - 140, 2016-06

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