Showing results 1 to 3 of 3
A new charge pumping model and characterization of process-dependent traps in polycrystalline silicon thin film transistors g.w. lee; c.h. han, JOURNAL OF THE ELECTROCHEMICAL SOCIETY, v.145, no.8, pp.2883 - 2886, 1998-08 |
Application of Electron-Cyclotron-Resonance Plasma Thermal-Oxidation to Bottom Gate Polysilicon Thin-Film Transistors j.i. han; Kim, Choong Ki; c.h. han, JAPANESE JOURNAL OF APPLIED PHYSICS, v.35, no.2B, pp.930 - 933, 1996-02 |
Stability of N-Channel Polysilicon Thin-Film Transistors with ECR Plasma Thermal Gate Oxide j.y. lee; c.h. han; Kim, Choong Ki, IEEE ELECTRON DEVICE LETTERS, v.17, no.4, pp.169 - 171, 1996-04 |
Discover