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In situ analysis of post-annealing effect on Sn-doped indium oxide films Lim, Hojoon; Yang, Hyeok-Jun; Kim, Ji Woong; Bae, Jong-Seung; Kim, Jin-Woo; Jeong, Beomgyun; Crumlin, Ethan; et al, JOURNAL OF APPLIED PHYSICS, v.120, no.20, 2016-11 |
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