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A study on the temperature dependence of characteristics of phase change memory devices Lee S.; Jeong D.S.; Jeong J.-H.; Zhe W.; Park Y.-W.; Ahn H.-W.; Kim W.M.; et al, APPLIED PHYSICS LETTERS, v.95, no.9, 2009 |
A study on the temperature dependence of the threshold switching characteristics of Ge2Sb2Te5 Lee S.; Jeong D.S.; Jeong J.-H.; Zhe W.; Park Y.-W.; Ahn H.-W.; Cheong B.-K., APPLIED PHYSICS LETTERS, v.96, no.2, 2010 |
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