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Showing results 1 to 4 of 4

1
A review on the recent developments of solution processes for oxide thin film transistors

Ahn, Byung Du; Jeon, Hye-Ji; Sheng, Jiazhen; Park, Jozeph; Park, Jin-Seong, SEMICONDUCTOR SCIENCE AND TECHNOLOGY, v.30, no.6, 2015-06

2
Effect of direct current sputtering power on the behavior of amorphous indium-gallium-zinc-oxide thin-film transistors under negative bias illumination stress: A combination of experimental analyses and device simulation

Jang, Jun Tae; Park, Jozeph; Ahn, Byung Du; Kim, Dong Myong; Choi, Sung-Jin; Kim, Hyun-Suk; Kim, Dae Hwan, APPLIED PHYSICS LETTERS, v.106, no.12, 2015-03

3
Flexible In-Ga-Zn-O thin-film transistors fabricated on polyimide substrates and mechanically induced instability under negative bias illumination stress

Park, Jozeph; Kim, Chang-Sun; Ahn, Byung Du; Ryu, Hojun; Kim, Hyun-Suk, JOURNAL OF ELECTROCERAMICS, v.35, no.1-4, pp.106 - 110, 2015-12

4
Study on the Photoresponse of Amorphous In-Ga-Zn-O and Zinc Oxynitride Semiconductor Devices by the Extraction of Sub-Gap-State Distribution and Device Simulation

Jang, Jun Tae; Park, Jozeph; Ahn, Byung Du; Kim, Dong Myong; Choi, Sung-Jin; Kim, Hyun-Suk; Kim, Dae Hwan, ACS APPLIED MATERIALS & INTERFACES, v.7, no.28, pp.15570 - 15577, 2015-07

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