Showing results 2 to 4 of 4
Time-resolved observation of Barkhausen avalanche in Co thin films using magneto-optical microscope magnetometer Kim, DH; Choe, SB; Shin, Sung-Chul, JOURNAL OF APPLIED PHYSICS, v.93, pp.6564 - 6566, 2003-05 |
Two-dimensional critical scaling behavior of Barkhausen avalanches (invited) Shin, Sung-Chul; Ryu, Kwang-Su; Kim, Dong-Hyun; Akinaga, Hiro, JOURNAL OF APPLIED PHYSICS, v.103, no.7, 2008-04 |
Universal Barkhausen critical scaling behavior observed in NixFe1-x (x=0-0.5) films Lee, Hun-Sung; Ryu, Kwang-Su; Kang, Im-Seok; Shin, Sung-Chul, JOURNAL OF APPLIED PHYSICS, v.109, no.7, 2011-04 |
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