내부 지터 발생기를 이용한 온칩의 지터 저항력 측정기Internal jitter tolerance tester with an internal jitter generator

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Assignee
KAIST
Country
US (United States)
Issue Date
2015-06-23
Application Date
2013-11-01
Application Number
14070249
Registration Date
2015-06-23
Registration Number
9065653
URI
http://hdl.handle.net/10203/232123
Appears in Collection
EE-Patent(특허)
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