Computer-aided simulation method for atomic-resolution scanning seebeck microscope (SSM) images주사 제벡 현미경 (SSM) 이미지 극소의 해상도를 위한 컴퓨터 지원 시뮬레이션법

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dc.contributor.author김용현ko
dc.contributor.author여호기ko
dc.contributor.author이의섭ko
dc.date.accessioned2017-12-20T04:36:54Z-
dc.date.available2017-12-20T04:36:54Z-
dc.date.issued2015-07-14-
dc.identifier.urihttp://hdl.handle.net/10203/230984-
dc.description.abstractA computer-aided simulation method for an atomic-resolution scanning Seebeck microscope (SSM) image is provided. In the computer-aided simulation method, a computer may calculate a local thermoelectric voltage for a position of a voltage probe, to acquire an SSM image corresponding to the position.-
dc.titleComputer-aided simulation method for atomic-resolution scanning seebeck microscope (SSM) images-
dc.title.alternative주사 제벡 현미경 (SSM) 이미지 극소의 해상도를 위한 컴퓨터 지원 시뮬레이션법-
dc.typePatent-
dc.type.rimsPAT-
dc.contributor.localauthor김용현-
dc.contributor.nonIdAuthor여호기-
dc.contributor.nonIdAuthor이의섭-
dc.contributor.assigneeKAIST-
dc.identifier.iprsType특허-
dc.identifier.patentApplicationNumber14299170-
dc.identifier.patentRegistrationNumber9081030-
dc.date.application2014-06-09-
dc.date.registration2015-07-14-
dc.publisher.countryUS-
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