Computer-aided simulation method for atomic-resolution scanning seebeck microscope (SSM) images주사 제벡 현미경 (SSM) 이미지 극소의 해상도를 위한 컴퓨터 지원 시뮬레이션법
| DC Field | Value | Language |
|---|---|---|
| dc.contributor.author | 김용현 | ko |
| dc.contributor.author | 여호기 | ko |
| dc.contributor.author | 이의섭 | ko |
| dc.date.accessioned | 2017-12-20T04:36:54Z | - |
| dc.date.available | 2017-12-20T04:36:54Z | - |
| dc.date.issued | 2015-07-14 | - |
| dc.identifier.uri | http://hdl.handle.net/10203/230984 | - |
| dc.description.abstract | A computer-aided simulation method for an atomic-resolution scanning Seebeck microscope (SSM) image is provided. In the computer-aided simulation method, a computer may calculate a local thermoelectric voltage for a position of a voltage probe, to acquire an SSM image corresponding to the position. | - |
| dc.title | Computer-aided simulation method for atomic-resolution scanning seebeck microscope (SSM) images | - |
| dc.title.alternative | 주사 제벡 현미경 (SSM) 이미지 극소의 해상도를 위한 컴퓨터 지원 시뮬레이션법 | - |
| dc.type | Patent | - |
| dc.type.rims | PAT | - |
| dc.contributor.localauthor | 김용현 | - |
| dc.contributor.nonIdAuthor | 여호기 | - |
| dc.contributor.nonIdAuthor | 이의섭 | - |
| dc.contributor.assignee | KAIST | - |
| dc.identifier.iprsType | 특허 | - |
| dc.identifier.patentApplicationNumber | 14299170 | - |
| dc.identifier.patentRegistrationNumber | 9081030 | - |
| dc.date.application | 2014-06-09 | - |
| dc.date.registration | 2015-07-14 | - |
| dc.publisher.country | US | - |
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