DC Field | Value | Language |
---|---|---|
dc.contributor.author | LEE, KW | ko |
dc.contributor.author | Lee, Kwyro | ko |
dc.contributor.author | SHUR, MS | ko |
dc.contributor.author | VU, TT | ko |
dc.contributor.author | ROBERTS, PCT | ko |
dc.contributor.author | HELIX, MJ | ko |
dc.date.accessioned | 2011-03-21T07:03:09Z | - |
dc.date.available | 2011-03-21T07:03:09Z | - |
dc.date.created | 2012-02-06 | - |
dc.date.created | 2012-02-06 | - |
dc.date.issued | 1985 | - |
dc.identifier.citation | IEEE TRANSACTIONS ON ELECTRON DEVICES, v.32, no.5, pp.987 - 992 | - |
dc.identifier.issn | 0018-9383 | - |
dc.identifier.uri | http://hdl.handle.net/10203/22841 | - |
dc.description.sponsorship | We would like to thank R.Jiracek of SRC, Honeywell, for his help in the wafer testing. We also acknowledge useful and fruitful discussions of this work Dr.W.Frensley. | en |
dc.language | English | - |
dc.language.iso | en_US | en |
dc.publisher | IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC | - |
dc.title | SOURCE, DRAIN, AND GATE SERIES RESISTANCES AND ELECTRON SATURATION VELOCITY IN ION-IMPLANTED GAAS-FETS | - |
dc.type | Article | - |
dc.identifier.wosid | A1985AFM4500020 | - |
dc.identifier.scopusid | 2-s2.0-0022061068 | - |
dc.type.rims | ART | - |
dc.citation.volume | 32 | - |
dc.citation.issue | 5 | - |
dc.citation.beginningpage | 987 | - |
dc.citation.endingpage | 992 | - |
dc.citation.publicationname | IEEE TRANSACTIONS ON ELECTRON DEVICES | - |
dc.identifier.doi | 10.1109/T-ED.1985.22058 | - |
dc.embargo.liftdate | 9999-12-31 | - |
dc.embargo.terms | 9999-12-31 | - |
dc.contributor.localauthor | Lee, Kwyro | - |
dc.contributor.nonIdAuthor | LEE, KW | - |
dc.contributor.nonIdAuthor | SHUR, MS | - |
dc.contributor.nonIdAuthor | VU, TT | - |
dc.contributor.nonIdAuthor | ROBERTS, PCT | - |
dc.contributor.nonIdAuthor | HELIX, MJ | - |
dc.type.journalArticle | Article | - |
Items in DSpace are protected by copyright, with all rights reserved, unless otherwise indicated.