DC Field | Value | Language |
---|---|---|
dc.contributor.author | Kim, Joungho | ko |
dc.contributor.author | Kim, Youngwoo | ko |
dc.contributor.author | Cho, Kyungjun | ko |
dc.contributor.author | Park, Gapyeol | ko |
dc.contributor.author | Kim, Subin | ko |
dc.contributor.author | Kang, Kibum | ko |
dc.contributor.author | So, Kwangsup | ko |
dc.contributor.author | Jeon, Jiwon | ko |
dc.contributor.author | Kim, Chungju | ko |
dc.contributor.author | Paik, Woohyun | ko |
dc.date.accessioned | 2017-12-05T02:43:42Z | - |
dc.date.available | 2017-12-05T02:43:42Z | - |
dc.date.created | 2017-11-29 | - |
dc.date.issued | 2017-01-31 | - |
dc.identifier.citation | DesignCon 2017 | - |
dc.identifier.uri | http://hdl.handle.net/10203/227745 | - |
dc.language | English | - |
dc.publisher | DesignCon 2017 | - |
dc.title | Power and Signal Integrity Analysis of Fan-out Wafer Level Package for Mobile Application Processor | - |
dc.type | Conference | - |
dc.type.rims | CONF | - |
dc.citation.publicationname | DesignCon 2017 | - |
dc.identifier.conferencecountry | US | - |
dc.identifier.conferencelocation | Santa Clara Convention Center, Santa Clara, California | - |
dc.contributor.localauthor | Kim, Joungho | - |
dc.contributor.nonIdAuthor | Kim, Youngwoo | - |
dc.contributor.nonIdAuthor | Cho, Kyungjun | - |
dc.contributor.nonIdAuthor | Park, Gapyeol | - |
dc.contributor.nonIdAuthor | Kim, Subin | - |
dc.contributor.nonIdAuthor | Kang, Kibum | - |
dc.contributor.nonIdAuthor | So, Kwangsup | - |
dc.contributor.nonIdAuthor | Jeon, Jiwon | - |
dc.contributor.nonIdAuthor | Kim, Chungju | - |
dc.contributor.nonIdAuthor | Paik, Woohyun | - |
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