Measurement and Comparative Analysis of Shielding Effectiveness of Different Sputtered Materials
| DC Field | Value | Language |
|---|---|---|
| dc.contributor.author | Kim, Joungho | ko |
| dc.contributor.author | Song, Kyunghwan | ko |
| dc.contributor.author | Cho, Yeonje | ko |
| dc.contributor.author | Kim, Subin | ko |
| dc.contributor.author | Jeong, Seungtaek | ko |
| dc.date.accessioned | 2017-12-05T02:22:34Z | - |
| dc.date.available | 2017-12-05T02:22:34Z | - |
| dc.date.created | 2017-11-29 | - |
| dc.date.created | 2017-11-29 | - |
| dc.date.created | 2017-11-29 | - |
| dc.date.issued | 2017-08-09 | - |
| dc.identifier.citation | IEEE International Symposium on Electromagnetic Compatibility | - |
| dc.identifier.uri | http://hdl.handle.net/10203/227627 | - |
| dc.language | English | - |
| dc.publisher | IEEE International Symposium on Electromagnetic Compatibility | - |
| dc.title | Measurement and Comparative Analysis of Shielding Effectiveness of Different Sputtered Materials | - |
| dc.type | Conference | - |
| dc.identifier.wosid | 000428753300220 | - |
| dc.identifier.scopusid | 2-s2.0-85039167276 | - |
| dc.type.rims | CONF | - |
| dc.citation.publicationname | IEEE International Symposium on Electromagnetic Compatibility | - |
| dc.identifier.conferencecountry | US | - |
| dc.identifier.conferencelocation | National Harbor | - |
| dc.contributor.localauthor | Kim, Joungho | - |
| dc.contributor.nonIdAuthor | Song, Kyunghwan | - |
| dc.contributor.nonIdAuthor | Cho, Yeonje | - |
| dc.contributor.nonIdAuthor | Kim, Subin | - |
| dc.contributor.nonIdAuthor | Jeong, Seungtaek | - |
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